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The LS 13 320 XR particle size analyzer features a significantly improved particle analysis range. The improved electronics and optical detection system extend the analysis
range providing actual measurement capability from 10nm to 3500μm while improving individual peak discrimination. With this new capability come a new set of control
standards to adequately verify instrument & module performance. Periodic performance checks using these controls will provide the customer confidence that their measurement system is operating at peak performance levels.
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